Scan chain

Results: 79



#Item
61Integrated circuits / Electronic design / Software testing / Automatic test pattern generation / Scan chain / Code coverage / Automatic test equipment / Fault coverage / Electronic engineering / Electronics / Electronic design automation

Datasheet DFTMAX Ultra Compression for Highest Test Quality and Lowest Test Cost Overview

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:32:25
62ARM architecture / Microprocessors / Automatic test pattern generation / Multi-core processor / Scan chain / ARM Cortex-A15 MPCore / Tegra / Embedded system / Central processing unit / Electronic engineering / Computer architecture / Electronics

White Paper DFTMAX Compression Shared I/O Minimize the Cost of Testing ARM® Processor-based Designs and Other Multicore SoCs July 2013

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-19 16:15:31
63Electronic design automation / Electronic design / Integrated circuits / Scan chain / Automatic test pattern generation / Fault coverage / Electronics manufacturing / Test compression / Design for testing / Electronic engineering / Electronics / Design

White Paper DFTMAX Ultra New Technology to Address Key Test Challenges September 2013

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:32:17
64Electronics manufacturing / Electronic design / Integrated circuits / Automatic test pattern generation / Test compression / Scan chain / Joint Test Action Group / Boundary scan / Physical design / Electronic engineering / Electronics / Electronic design automation

Datasheet DFTMAX High Quality, Low Cost Test Overview

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Source URL: www.synopsys.com

Language: English - Date: 2015-03-20 14:15:36
65Integrated circuits / Automatic test pattern generation / Electronics manufacturing / Electronic design / Test compression / Scan chain / Iddq testing / Joint Test Action Group / Synopsys / Electronic engineering / Electronics / Electronic design automation

Datasheet TetraMAX ATPG Automatic Test Pattern Generation Overview

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Source URL: www.synopsys.com

Language: English - Date: 2015-02-18 14:15:52
66Government Finance Officers Association / Invoice / Fax / Accounts payable / Purchasing / Credit card / Mail / Payment / Email / Business / Technology / Supply chain management

Order online at www.gfoa.org, by mail, fax, or scan the completed form and e-mail it to [removed]. o Indicate if you are faxing or scanning and e-mailing this form. (Faxes and e-mails are accepted only with c

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Source URL: www.gfoa.co

Language: English - Date: 2014-05-14 17:05:22
67Manufacturing / Joint Test Action Group / Boundary scan / Scan chain / Test compression / Automatic test pattern generation / Block cipher / Man-in-the-middle attack / Side channel attack / Electronic engineering / Electronics / Electronics manufacturing

IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING Received 30 April 2013; revised 6 October 2013; accepted 22 December[removed]Date of publication 5 February 2014; date of current version 7 May 2014.

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Source URL: www.computer.org

Language: English - Date: 2014-06-16 15:59:17
68Management / Electronic commerce / Procurement / Supply chain / E-procurement / Manufacturing / Scan-based trading / Business / Technology / Supply chain management

Microsoft Word - Supplier Engagement.docx

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Source URL: www.ghgprotocol.org

Language: English - Date: 2011-10-03 22:29:58
69Management / Sterling Commerce / Supply chain / Logistics / Military supply chain management / Scan-based trading / Business / Supply chain management / Technology

IBM Sterling Warehouse Management System

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Source URL: public.dhe.ibm.com

Language: English - Date: 2014-07-31 11:40:03
70Online shopping / Vendor / Service-oriented architecture / Product / Scan-based trading / Business / Management / Electronic commerce

Tradeflow® ROI Tradeflow customers have seen improvements to their compliance and supply chain process in different ways. The goal of using Tradeflow is to have a platform, around which you can build a solid compliance

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Source URL: www.expeditors.com

Language: English - Date: 2012-05-22 18:42:15
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